IEEE AP-S/URSI 2021
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Session TU-UE.1A
Paper TU-UE.1A.1
TU-UE.1A.1
Electromagentic Impact of Parasitic Effects on the STDP Characteristics in Neuromorphic Memristor Crossbar Arrays
Tuomin Tao, Hanzhi Ma, Quankun Chen, Shurun Tan, Er-Ping Li, Zhejiang University, China; En-Xiao Liu, A*STAR Institute of High Performance Computing, Singapore
Session:
Electromagnetic Environment and Interference
Track:
URSI-E Electromagnetic Environment and Interference
Location:
Virtual (Chairs/Speakers to go to Melati Ballroom 4002)
Presentation Time:
Tue, 7 Dec, 10:20 - 10:40 Singapore Time (UTC +8)
Tue, 7 Dec, 03:20 - 03:40 France Time (UTC +1)
Tue, 7 Dec, 02:20 - 02:40 UTC
Mon, 6 Dec, 21:20 - 21:40 New York Time (UTC -5)
Session Co-Chairs:
Er-Ping Li, Zhejiang University and Enxiao Liu, Institute of High Performance Computing
Session Manager:
Room R9 Manager
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Session TU-UE.1A
TU-UE.1A.1: Electromagentic Impact of Parasitic Effects on the STDP Characteristics in Neuromorphic Memristor Crossbar Arrays
Tuomin Tao, Hanzhi Ma, Quankun Chen, Shurun Tan, Er-Ping Li, Zhejiang University, China; En-Xiao Liu, A*STAR Institute of High Performance Computing, Singapore
TU-UE.1A.2: Using Square Cross Structure for Far-End Crosstalk Reduction on Microstrip Signal Lines in DDR5
Qiang-Ming Cai, Xiao-Bo Yu, Liang Zhang, Chao Zhang, Lin Zhu, Xin Cao, Jun Fan, Southwest University of Science and Technology, China; Yinglei Ren, Xiaoning Ye, Intel Corporation, China
TU-UE.1A.3: Far-End Crosstalk Mitigation for Transmission Lines in DDR5 Using Glass-Weave Coating Structure
Xiao-Bo Yu, Qiang-Ming Cai, Liang Zhang, Chao Zhang, Lin Zhu, Xin Cao, Jun Fan, Southwest University of Science and Technology, China; Yinglei Ren, Xiaoning Ye, Intel Corporation, China
TU-UE.1A.4: Three-Dimensional Analysis of Propagation Characteristics in an Urban Environment Using Large-scaled FDTD simulation
Hikage Takashi, Kazuki Yoshida, Manabu Yamamoto, Manabu Omiya, Hokkaido University, Japan; Nobuaki Kuno, Minoru Inomata, Wataru Yamada, NTT Corporation, Japan
TU-UE.1A.5: Evaluation of Interference Path Loss Characteristics in Sub-6 GHz/5G Frequency Bands for Small Aircraft Using Large-scale FDTD Analysis
Ai Sato, Takashi Hikage, Manabu Omiya, Hokkaido University, Japan; Shunichi Futatsumori, Naruto Yonemoto, National Institute of Maritime, Port and Aviation Technology, Japan
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