TU-UE.1A.1: Electromagentic Impact of Parasitic Effects on the STDP Characteristics in Neuromorphic Memristor Crossbar Arrays
Tuomin Tao, Hanzhi Ma, Quankun Chen, Shurun Tan, Er-Ping Li, Zhejiang University, China; En-Xiao Liu, A*STAR Institute of High Performance Computing, Singapore
TU-UE.1A.2: Using Square Cross Structure for Far-End Crosstalk Reduction on Microstrip Signal Lines in DDR5
Qiang-Ming Cai, Xiao-Bo Yu, Liang Zhang, Chao Zhang, Lin Zhu, Xin Cao, Jun Fan, Southwest University of Science and Technology, China; Yinglei Ren, Xiaoning Ye, Intel Corporation, China
TU-UE.1A.3: Far-End Crosstalk Mitigation for Transmission Lines in DDR5 Using Glass-Weave Coating Structure
Xiao-Bo Yu, Qiang-Ming Cai, Liang Zhang, Chao Zhang, Lin Zhu, Xin Cao, Jun Fan, Southwest University of Science and Technology, China; Yinglei Ren, Xiaoning Ye, Intel Corporation, China
TU-UE.1A.4: Three-Dimensional Analysis of Propagation Characteristics in an Urban Environment Using Large-scaled FDTD simulation
Hikage Takashi, Kazuki Yoshida, Manabu Yamamoto, Manabu Omiya, Hokkaido University, Japan; Nobuaki Kuno, Minoru Inomata, Wataru Yamada, NTT Corporation, Japan
TU-UE.1A.5: Evaluation of Interference Path Loss Characteristics in Sub-6 GHz/5G Frequency Bands for Small Aircraft Using Large-scale FDTD Analysis
Ai Sato, Takashi Hikage, Manabu Omiya, Hokkaido University, Japan; Shunichi Futatsumori, Naruto Yonemoto, National Institute of Maritime, Port and Aviation Technology, Japan
